Robust: With excellent stability and a small footprint the architecture of the NANOS ensures it can be used in non-laboratory environments.
Ease of use: The NANOS will produce results in a short period of time, regardless of experience. Added software can provides further functionality for detailed analysis.
Cost of ownership: The NANOS has been engineered to keep the cost of ownership lower than any benchtop SEM currently available.
Servicing:The NANOS design allows easy access for maintenance and upgrades which can be completed at your premises.

The NANOS SEM includes high-performance secondary electron (SE) and backscattered electron (BSE) detectors, along with integrated energy dispersive X-ray spectroscopy (EDX) for comprehensive elemental analysis. Additionally, it features a eucentric tilt stage, allowing precise control and maintaining focus during tilting, enhancing the examination of complex samples

Description

High-Performance Detectors: Equipped with Secondary Electron Detectors (SED) and Backscattered Electron Detectors (BSD) for detailed imaging.
Integrated EDX System: Allows for rapid elemental analysis, enhancing the versatility of the microscope.
Eucentric Tilt Stage: Ensures samples stay in focus during tilting, enabling precise imaging.
Robust and Compact Design: Suitable for various environments beyond traditional laboratories, thanks to its stability and small footprint.
User-Friendly Interface: Features both basic and advanced modes to accommodate users of all experience levels.
Low Vacuum Mode: Reduces charging effects in non-conductive samples, improving image quality.
Optimized Thermionic Source: Tungsten filament that can be user-replaced, reducing downtime and maintenance costs

Specifications

IMAGING MODE
Optical	2 & 12x optical. Up to 60x digital zoom
SEM	Magnification range: 100 - 200.000x
Resolution	<8 nm
ILLUMINATION
Optical	Bright field
SEM	Optimized thermionic source (tungsten)
Acceleration voltages	Default: 1, 2, 5, 7, 10, 15 & 20 kV

DETECTOR
	Secondary electron detector (SED)
	Backscattered electron detector (BSD) – 4 quadrant
	Energy Dispersive Spectroscopy detector (EDS) – embedded
LIGHT OPTICAL NAVIGATION CAMERA
	Color
IMAGE FORMATS
	JPEG, TIFF, PNG, BMP
USER INTERFACE
	Communication, imaging and analysis use a single monitor with control via a wireless mouse & keyboard
	Remote control and diagnostic enabled

DATA STORAGE
	Network, USB, workstation
SAMPLE STAGE
	Eucentric tilt stage (+15 up to -40 ̊) manual
	Computer-controlled motorized X, Y: 25 x 25 mm
SAMPLE SIZE
	Up to 45 mm diameter
	Up to 14 mm height (optional 45 mm)
EDS SPECIFICATIONS
Detector type	Silicon Drift Detector (SDD), thermo-electrically cooled
Detector active area	30 mm2
Energy resolution	@ Mn Kα < 133 eV
Max. input count rate	300,000 cps
Hardware integration	Fully embedded SDD, pulse processor and scan generator
SOFTWARE
	Installed on Windows PC and controlled via user interface
	EDS point analysis, line analysis and mapping
	Export functions
SYSTEM SPECIFICATIONS
Footprint	280 (w) x 470 (d) x 550 (h) mm
Detector active area	30 mm2
Weight	62 kg
Pumps	Pfeiffer Turbo molecular pump and an oil free membrane pre-vacuum pump
Vacuum modes	High vacuum SEM mode (standard) Low vacuum mode (standard): vacuum of 40 Pascal for reduced charging Motor controlled vacuum levels via the User Interface
Workstation	Preconfigured All-in-One PC with a 27” monitor. SEM imaging and EDS Analysis software installed

Contact

You have a question and would like to get in touch with our experts? We look forward to receiving your enquiry.

Your message

Your name

Your email address

Your phone number

Sysmex Nederland B.V.

Ecustraat 11

4879 NP Etten-Leur

The Netherlands

www.sysmex.nl

+31 (0)76 508 6000

+31 (0)76 508 6086

info@sysmex.nl

Sysmex Belgium N.V.

Chaussée de Bruxelles 135A

1310 La Hulpe

Belgium

www.sysmex.be

+32 (0)2 769 7474

+32 (0)2 7697499

info@sysmex.be